Microscopic optoelectronic defectoscopy of solar cells

Microscopic optoelectronic defectoscopy of solar cells

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Scanning probe microscopes are powerful tool for micro- or nanoscale diagnostics of defects in crystalline silicon solar cells.Solar cell is a large p-n junction semiconductor device.Its quality is iphone 14 price arizona strongly damaged by the presence of defects.If the cell works under low reverse-biased voltage, defects emit a light in visible range.

The suggested life extension blueberry extract method combines three different measurements: electric noise measurement, local topography and near-field optical beam induced current and thus provides more complex information.To prove its feasibility, we have selected one defect (truncated pyramid) in the sample, which emitted light under low reverse-biased voltage.